NMR Lab The NMR (nuclear magnetic resonance) lab is a facility of the chemistry department; its principal job is to provide access to NMR equipment and techniques for departmental research. It is also available to outside departments within the university, and to a limited degree to external organizations. Some service work is performed, but in most cases users operate the equipment themselves, and generate and process their own data. VI-500 Varian Inova VI-300 Varian Inova VXR-300 Varian Inova VAC-300 Varian Unity, with automatic sample changer VAC-200 Varian Unity, with automatic sample changer

Part of the San Diego Nanotechnology Infrastructure (SDNI), the facility provides access to an array of state-of-the-art equipment for nanomaterial (both thin-film andRigaku-SmartLab-9-kW-XRD.jpeg powder) characterization, including XRD, XPS, Hall effect, UV-Vis, AFM/MFM, SEM, and photo current systems to measure crystal structure, and magnetic, surface, transport, and optical properties.

Hitachi UH4150 UV-Visible/NIR Spectrophotometer (Nicholas Patterson)
JEOL JSM-7400F Field Emission Scanning Electron Microscope (TBD)
Kobelco Photocurrent Measurement System (Kenji Nomura)
Lake Shore 8400 Series Hall Effect Measurement System (Mohammed El Hadri)
Panalytical XPert XRD - Line Source (Yasuhiro Kodera)
Panalytical XPert XRD - Point Source (Yasuhiro Kodera)
PHI Quantera Scanning XPS (Sicen Yu)
Bruker D2 Phaser Benchtop XRD (TBD)
Rigaku Smartlab XRD (Dylan Cheng)
Veeco Dimension 3100 AFM/MFM (Jeffrey Brock)

The Powder and High-Resolution XRD facility is equipped with two highly versatile multipurpose X-ray diffractometers from Rigaku, SmartLab and SmartLab SE with built-in intelligent guidance. The combined capabilities of the diffractometers provide a comprehensive structural characterization of various types of materials (metals, ceramics, nanoparticles, polymers, geological specimens) in either bulk or thin-film form. The structural materials characterization includes phase identification, qualitative and quantitative composition analysis, differentiation between crystalline and amorphous phases, determination of structure, lattice parameters, orientation and texture, evaluation of crystallite sizes and strains, monitoring of quality control.

The SmartLab SE system currently has para-focusing optics (Bragg-Brentano geometry) that allows powder XRD measurements for powder samples. XRD measurement performed by SmartLab SE is controlled by a built-in software program SmartLab Studio II. The rapid phase identification analysis and quantitative analysis of powder samples are available using SmartLab Studio II. The SmartLab SE system is equipped with a 1D ceramic strip detector D/teX Ultra250 that detects and integrates X-ray intensity efficiently, so that data can be collected as fast as within a few minutes. In addition, the detector has high resolution and therefore can reduce the overall background of the measurement enabling the detection of XRD peaks of minor components easily.

SmartLab from Rigaku is a horizontal sample mount multipurpose X-ray diffractometer that permits measurements and characterization for both powder and thin-film samples. The instrument is equipped with a cross beam optics (CBO) unit that enables easy switching between the direct beam para-focusing (BB) and parallel beam (PB) geometries simply by changing a selection slit. Additionally, features and capabilities include:

• 3kW long-focus sealed-tube Cu X-ray generator
• A theta-theta goniometer (omega scans, 2-theta/omega scans, 2-theta scans)
• A chi axis (tilt adjustment), a Z axis (thickness adjustment), and a phi axis (adjustment of in-plane orientation)
• The in-plane arm and RxRy attachment
• Ge(220) 2-bounce and Ge(220) 4-bounce monochromators
• CBO-f unit for measurements of micro area (μ-XRD) and micro amount of sample
• Interchangeable double-slit analyzer, parallel-slit analyzer, and 2-bounce analyzer on receiving side
• The two-slit SAXS optics with a multilayer mirror

SmartLab diffractometer allows the high-resolution XRD that includes Grazing Incidence Diffraction (GID), reflectivity (XRR), rocking curves, and reciprocal space mapping (RSM) measurements and analysis of thin films. Compared to powder XRD which allows first of all phase identification and structure analysis, the high-resolution XRD methods allow measurements of film thickness, film density, surface or interface roughness, film quality, complete film orientation, as well as strain state and strain distribution which is important for epitaxial thin films grown on solid substrates.

The Powder and High-Resolution X-Ray Diffraction facility is available to Penn faculty, staff and students, and to outside users on an hourly fee basis.

Instrument	Non-Penn academic users	Industrial users
Rigaku SmartLab SE	$6/hour	$100/hour or $1000/24-hour day
Rigaku SmartLab	$12/hour	$200/hour or $2000/24-hour day

There is no charge for initial training.

XRD Measurement Service is available at an additional 39% administrative fee to the total cost of service for outside users who are unable to visit the facility directly.

Facilities users must include the following text in the acknowledgment section of their publications:

“The authors acknowledge the use of the XRD facility supported by the Laboratory for Research on the Structure of Matter and the NSF through the University of Pennsylvania Materials Research Science and Engineering Center (MRSEC) DMR-2309043.”

Oversight Committee:

Thomas Mallouk

Christopher Murray

Eric Stach

https://www.ccmr.cornell.edu/facilities/glass-shop/

The University of Wisconsin – Madison, College of Engineering, Wisconsin Centers for Nanoscale Technology are shared instrumentation facilities providing equipment, facilities, and expertise in microelectronics, nano-fabrication technology, electron microscopy, micro-analysis and soft materials characterization in support of the University’s research endeavor.

The Electron Microscopy Facility is a joint BSD/PSD resource available to all campus researchers. Users have access to an FEI Tecnai F30 scanning/transmission electron microscope. The microscope has a point-to-point resolution of 0.2 nm when operated in the TEM mode and a spatial resolution of 0.2 nm for the STEM mode.The facility is located in the sub-basement of the Gordon Center for Integrative Science, right next to the MRSEC shared facilities. This forms a synergistic cluster with the SEM and SPM instrumentation maintained by MRSEC’s Materials Prep Lab. The Electron Microscopy facility provides sample preparation, imaging, consultation, and training services for transmission electron microscopy.

Physical Science services include: phase-contrast TEM imaging which provides information on materials structures at atomic resolution; diffraction contrast imaging which is used for morphology and defect investigation; STEM Z-contrast imaging which presents information not only on crystal structure but also on chemical composition at atomic resolution; electron diffraction that can be used for crystal structure and orientation investigation; elemental analysis using X-ray energy-dispersive spectrometry; and tomography for 3D structure determination. This TEM is used extensively for imaging of polymer and nanocrystal samples (IRG 2).

Biological Science services include: Classic chemical fixation and cryopreservation; tissue embedding; sectioning; negative staining; immunocytochemistry, and imaging. Also, available is 3-D electron tomography of samples, which allows accurate three-dimensional reconstruction of biological samples at 5 – 7 nm resolution. This method is proving to be indispensable for understanding how molecular structures are linked to cellular architecture and function. An added benefit will be the capacity to perform correlated fluorescence and 3D electron microscopy. Correlative microscopy is an emerging technique that utilizes the complementary visual techniques of light microscopy, the ability to localize macromolecular structures of interest, and electron microscopy, which provides high-resolution cellular context. The combination of both LM/EM would allow researches to capture populations of cells, identify cellular features or fluorescently labeled proteins of interest, and then capture high-resolution (3-7 nm) three-dimensional cellular volume reconstructions of pre-identified cellular regions, with high sensitivity and spatial precision

NanoSystems Laboratory is a user facility located on the main campus of the Ohio State University (Columbus, OH) in the Physics Research Building. The facility is open to all interested users on the user fee basis. Our goal is to provide academic and industrial users with access to advanced material characterization and fabrication tools for research and development applications. Research capabilities available at ENSL include focused ion beam/scanning electron microscopy, e-beam lithography, nanomanipulation, EDS X-ray microanalysis, X-ray diffractometry, SQUID magnetometry, atomic force/magnetic force microscopy, low temperature magnetotransport measurements.

The Center for Electron Microscopy and Analysis (CEMAS) at OSU provides state-of-the-art analytical electron microscopy services to OSU, central Ohio and the broader community.

The LRSM installed a new Multi-angle Light Scattering Instrument – an LS Spectrometer, from LS instruments in the Spring of 2023. This instrument enables a broad range of materials characterization through static and dynamic light scattering. Capabilities enabled by the SLS/DLS instrument include particle size determination, studies of relaxation dynamics, and investigation of thermodynamic interactions of species in suspension (e.g., nanoparticles; polymers; colloidal species).

The instrument is equipped with a 3D Cross-correlation capability that enables it to distinguish intensity decorrelation that originates from single vs multiple scattering events. As a result, the instrument can be used to collect dynamic light scattering data from samples that exhibit multiple scattering, i.e. concentrated, opaque systems. The Modulated 3D Cross-Correlation option enhances the signal from the cross-correlation measurement. Additional options include sample rotation (for measurements of non-ergodic systems), and temperature resolved measurements.

Standard measurements:

• Particle sizing: hydrodynamic Radius (R_h) and radius of gyration (R_g)
• Size distribution and polydispersity
• Particle dynamics: diffusion coefficient, mean square displacement,
• Polymer molecular weight (MW ~ 360 – 3600000 Dalton)
• 2nd virial coefficient
• Rayleigh ratio
• Form and structure factors
• Inter-particle distance in charged systems
• Aggregation
• Etc.

Specifications:

Sample volume	50 μL to 4 ml
Particle size range (Rh)	0.15 nm to 5 μm
Radius of gyration (Rg)	5 nm to 5 μm
Molecular weight	360 – 3,600,000 Dalton
Angular range	12° to 150° (+/- 0.01°) Recommended 15° to 150°
Laser	Fiber-coupled laser 120 mW, 638 nm
Correlator	320 channels, delay time 12.5 ns to 15 h, auto- and cross-correlation
Temperature	up to 90 °C

For light scattering tutorials:

• LS Spectrometer User Manual
• LS Instrument Training Presentation
• Manual Zim Plot
• Reports and Additionals (Access request needed for download)
• Python Code Demo for Plotting